| CQSZ |
INCLOSURE CONFIGURATION |
DUAL-IN-LINE |
| ADAQ |
BODY LENGTH |
1.290 INCHES MAXIMUM |
| CZER |
MEMORY DEVICE TYPE |
EPROM |
| CZEP |
CAPITANCE RATING PER CHARACTERISTIC |
6.00 INPUT PASCAL DENSE STRUCTURAL 65 AND 12.00 OUTPUT PASCAL DENSE STRUCTURAL 65 |
| ADAU |
BODY HEIGHT |
0.160 INCHES MINIMUM AND 0.220 INCHES MAXIMUM |
| ADAT |
BODY WIDTH |
0.500 INCHES MINIMUM AND 0.610 INCHES MAXIMUM |
| CQZP |
INPUT CIRCUIT PATTERN |
13 INPUT |
| CBBL |
FEATURES PROVIDED |
BURN IN AND ELECTROSTATIC SENSITIVE AND HERMETICALLY SEALED AND ULTRAVIOLET ERASABLE |
| AEHX |
MAXIMUM POWER DISSIPATION RATING |
1.0 WATTS |
| CZEN |
VOLTAGE RATING AND TYPE PER CHARACTERISTIC |
-0.3 VOLTS MINIMUM POWER SOURCE AND 6.0 VOLTS MAXIMUM POWER SOURCE |
| TTQY |
TERMINAL TYPE AND QUANTITY |
24 PRINTED CIRCUIT |
| AFJQ |
STORAGE TEMP RANGE |
-55.0/+125.0 DEG CELSIUS |
| CQSJ |
INCLOSURE MATERIAL |
CERAMIC |
| PKWT |
UNPACKAGED UNIT WEIGHT |
6.5 GRAMS |
| CRHL |
BIT QUANTITY (NON-CORE) |
16384 |
| CZEQ |
TIME RATING PER CHACTERISTIC |
450.00 NANOSECONDS MAXIMUM DELAY |
| TEST |
TEST DATA DOCUMENT |
96906-MIL-STD-883 STANDARD |
| CSWJ |
WORD QUANTITY (NON-CORE) |
2048 |
| CQWX |
OUTPUT LOGIC FORM |
N-TYPE METAL OXIDE-SEMICONDUCTOR LOGIC |
| AFGA |
OPERATING TEMP RANGE |
-55.0/+100.0 DEG CELSIUS |
| ABHP |
OVERALL LENGTH |
1.290 INCHES MAXIMUM |
| CTQX |
CURRENT RATING PER CHARACTERISTIC |
115.00 MILLIAMPERES REVERSE CURRENT, DC ABSOLUTE |
| AGAV |
END ITEM IDENTIFICATION |
5895-01-167-7655 RECEIVING SET |
| CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |