| AFGA |
OPERATING TEMP RANGE |
-55.0/+125.0 DEG CELSIUS |
| CBBL |
FEATURES PROVIDED |
HERMETICALLY SEALED AND ELECTROSTATIC SENSITIVE AND BURN IN AND STATIC OPERATION |
| CTQX |
CURRENT RATING PER CHARACTERISTIC |
70.00 MILLIAMPERES REVERSE CURRENT, DC ABSOLUTE |
| TTQY |
TERMINAL TYPE AND QUANTITY |
32 J-HOOK |
| AEHX |
MAXIMUM POWER DISSIPATION RATING |
1.0 WATTS |
| ABMK |
OVERALL WIDTH |
0.508 INCHES MAXIMUM |
| CZEN |
VOLTAGE RATING AND TYPE PER CHARACTERISTIC |
5.5 VOLTS MAXIMUM POWER SOURCE |
| ABKW |
OVERALL HEIGHT |
0.185 INCHES NOMINAL |
| AFJQ |
STORAGE TEMP RANGE |
-55.0/+150.0 DEG CELSIUS |
| CQSJ |
INCLOSURE MATERIAL |
CERAMIC |
| CQSZ |
INCLOSURE CONFIGURATION |
LEADED CHIP CARRIER |
| CZEQ |
TIME RATING PER CHACTERISTIC |
90.00 NANOSECONDS MAXIMUM ACCESS |
| ADAT |
BODY WIDTH |
0.442 INCHES MINIMUM AND 0.458 INCHES MAXIMUM |
| CZEP |
CAPITANCE RATING PER CHARACTERISTIC |
10.00 INPUT PICOFARADS MAXIMUM AND 12.00 OUTPUT PICOFARADS MAXIMUM |
| CRHL |
BIT QUANTITY (NON-CORE) |
16384 |
| ADAQ |
BODY LENGTH |
0.540 INCHES MINIMUM AND 0.560 INCHES MAXIMUM |
| CQWX |
OUTPUT LOGIC FORM |
COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
| TEST |
TEST DATA DOCUMENT |
96906-MIL-STD-883 STANDARD |
| ABHP |
OVERALL LENGTH |
0.610 INCHES MAXIMUM |
| CZER |
MEMORY DEVICE TYPE |
RAM |
| CSWJ |
WORD QUANTITY (NON-CORE) |
2048 |
| ADAU |
BODY HEIGHT |
0.060 INCHES MINIMUM AND 0.120 INCHES MAXIMUM |
| CQZP |
INPUT CIRCUIT PATTERN |
22 INPUT |
| CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |