| AFGA |
OPERATING TEMP RANGE |
-55.0/+125.0 DEG CELSIUS |
| ABKW |
OVERALL HEIGHT |
0.045 INCHES MINIMUM AND 1.000 INCHES MAXIMUM |
| CBBL |
FEATURES PROVIDED |
BIDIRECTIONAL AND PROGRAMMABLE AND MONOLITHIC AND ELECTROSTATIC SENSITIVE |
| AEHX |
MAXIMUM POWER DISSIPATION RATING |
1.0 WATTS |
| ADAT |
BODY WIDTH |
0.245 INCHES MINIMUM AND 0.300 INCHES MAXIMUM |
| CXCY |
PART NAME ASSIGNED BY CONTROLLING AGENCY |
AND-OR INVERT GATE ARRAY |
| CQSZ |
INCLOSURE CONFIGURATION |
FLAT PACK |
| ABMK |
OVERALL WIDTH |
0.745 INCHES MINIMUM AND 1.040 INCHES MAXIMUM |
| AFJQ |
STORAGE TEMP RANGE |
-65.0/+150.0 DEG CELSIUS |
| CZER |
MEMORY DEVICE TYPE |
PAL |
| CZEN |
VOLTAGE RATING AND TYPE PER CHARACTERISTIC |
-0.5 VOLTS MINIMUM POWER SOURCE AND 7.0 VOLTS MAXIMUM POWER SOURCE |
| ADAQ |
BODY LENGTH |
0.540 INCHES MAXIMUM |
| CQSJ |
INCLOSURE MATERIAL |
CERAMIC |
| CQZP |
INPUT CIRCUIT PATTERN |
16 INPUT |
| ABHP |
OVERALL LENGTH |
0.540 INCHES MAXIMUM |
| ADAU |
BODY HEIGHT |
0.045 INCHES MINIMUM AND 0.100 INCHES MAXIMUM |
| CQWX |
OUTPUT LOGIC FORM |
TRANSISTOR-TRANSISTOR LOGIC |
| CTQX |
CURRENT RATING PER CHARACTERISTIC |
185.00 MILLIAMPERES REVERSE CURRENT, DC ABSOLUTE |
| TEST |
TEST DATA DOCUMENT |
96906-MIL-STD-883 STANDARD |
| CZEQ |
TIME RATING PER CHACTERISTIC |
30.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT AND 30.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT |
| TTQY |
TERMINAL TYPE AND QUANTITY |
20 FLAT LEADS |
| CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |
| CTFT |
CASE OUTLINE SOURCE AND DESIGNATOR |
F-9 MIL-M-38510 |