| CQSZ |
INCLOSURE CONFIGURATION |
DUAL-IN-LINE |
| AFGA |
OPERATING TEMP RANGE |
-55.0/+125.0 DEG CELSIUS |
| ADAQ |
BODY LENGTH |
1.635 INCHES MINIMUM AND 1.680 INCHES MAXIMUM |
| NHCF |
NUCLEAR HARDNESS CRITICAL FEATURE |
HARDENED |
| ADAU |
BODY HEIGHT |
0.160 INCHES MINIMUM AND 0.220 INCHES MAXIMUM |
| CZEQ |
TIME RATING PER CHACTERISTIC |
170.00 NANOSECONDS NOMINAL ACCESS |
| CZEN |
VOLTAGE RATING AND TYPE PER CHARACTERISTIC |
-0.6 VOLTS MINIMUM POWER SOURCE AND 7.0 VOLTS MAXIMUM POWER SOURCE |
| CSWJ |
WORD QUANTITY (NON-CORE) |
128000 |
| FEAT |
SPECIAL FEATURES |
HCP;ESD;ULTRAVIOLET EPROM;ALTEREDITEM FROM 11293/15-1326286-1 (5962-8961404XX) PROGRAM USING 11293/00-0035 |
| CRTL |
CRITICALITY CODE JUSTIFICATION |
CBBL |
| CXCY |
PART NAME ASSIGNED BY CONTROLLING AGENCY |
MICROCIRCUIT,EPROM(27C10) |
| AFJQ |
STORAGE TEMP RANGE |
-65.0/+150.0 DEG CELSIUS |
| CQSJ |
INCLOSURE MATERIAL |
CERAMIC |
| CZZZ |
MEMORY CAPACITY |
128KX8 |
| CZER |
MEMORY DEVICE TYPE |
PROGRAMMED |
| AGAV |
END ITEM IDENTIFICATION |
AC/RMPE REACT BASIC |
| CQWX |
OUTPUT LOGIC FORM |
COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
| TEST |
TEST DATA DOCUMENT |
96906-MIL-STD-883 STANDARD |
| CRHL |
BIT QUANTITY (NON-CORE) |
1024000 |
| TTQY |
TERMINAL TYPE AND QUANTITY |
32 BEAM LEAD |
| CBBL |
FEATURES PROVIDED |
ELECTROSTATIC SENSITIVE |
| ADAT |
BODY WIDTH |
0.565 INCHES MINIMUM AND 0.605 INCHES MAXIMUM |
| CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |