| CQSZ |
INCLOSURE CONFIGURATION |
DUAL-IN-LINE |
| AFGA |
OPERATING TEMP RANGE |
-55.0/+125.0 DEG CELSIUS |
| ADAU |
BODY HEIGHT |
0.225 INCHES MAXIMUM |
| CQZP |
INPUT CIRCUIT PATTERN |
24 INPUT |
| TTQY |
TERMINAL TYPE AND QUANTITY |
28 PRINTED CIRCUIT |
| CTQX |
CURRENT RATING PER CHARACTERISTIC |
100.00 MILLIAMPERES REVERSE CURRENT, DC ABSOLUTE |
| ADAT |
BODY WIDTH |
0.600 INCHES MAXIMUM |
| CBBL |
FEATURES PROVIDED |
BURN IN AND MONOLITHIC AND HERMETICALLY SEALED AND ERASABLE |
| CZEN |
VOLTAGE RATING AND TYPE PER CHARACTERISTIC |
5.25 VOLTS MAXIMUM POWER SOURCE |
| AFJQ |
STORAGE TEMP RANGE |
-65.0/+150.0 DEG CELSIUS |
| CSWJ |
WORD QUANTITY (NON-CORE) |
8192 |
| CQSJ |
INCLOSURE MATERIAL |
CERAMIC |
| ADAQ |
BODY LENGTH |
1.435 INCHES MINIMUM AND 1.480 INCHES MAXIMUM |
| CZEP |
CAPITANCE RATING PER CHARACTERISTIC |
10.00 INPUT PICOFARADS MAXIMUM AND 12.00 OUTPUT PICOFARADS MAXIMUM |
| TEST |
TEST DATA DOCUMENT |
96906-MIL-STD-883 STANDARD |
| CRHL |
BIT QUANTITY (NON-CORE) |
65536 |
| CQWX |
OUTPUT LOGIC FORM |
N-TYPE METAL OXIDE-SEMICONDUCTOR LOGIC |
| CZEQ |
TIME RATING PER CHACTERISTIC |
300.00 NANOSECONDS MAXIMUM ACCESS |
| CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |
| CZER |
MEMORY DEVICE TYPE |
EEPROM |