| AFGA |
OPERATING TEMP RANGE |
-55.0/+125.0 DEG CELSIUS |
| CXCY |
PART NAME ASSIGNED BY CONTROLLING AGENCY |
MICROCIRCUITS,DIGITAL,NMOS,8K X 8 EEPROM,MONOLITHIC SILICON; MICROCIRCUIT,DIGITAL,ELECTRICALLY ERASABLE PROM (8K X 8) |
| CBBL |
FEATURES PROVIDED |
W/ENABLE AND ERASABLE AND MONOLITHIC AND ELECTROSTATIC SENSITIVE AND SELECTED ITEM AND TESTED TO MIL-STD-883 AND RADIATION HARDENED AND PROGRAMMABLE |
| TTQY |
TERMINAL TYPE AND QUANTITY |
32 LEADLESS |
| AEHX |
MAXIMUM POWER DISSIPATION RATING |
1.0 WATTS |
| CTFT |
CASE OUTLINE SOURCE AND DESIGNATOR |
C-12 MIL-M-38510 |
| AFJQ |
STORAGE TEMP RANGE |
-65.0/+150.0 DEG CELSIUS |
| FEAT |
SPECIAL FEATURES |
ELECTROSTATIC DISCHARGE SENS/HARDNESS CRITICAL ITEM; SELECTED ITEM,MONOLITHIC SILICON,NMOS FLOATING GATE,64K-BIT,5V ELEC ERASABLE/PROGRAMMABLE EEPROM,ORIG PN 5962-8683004YX |
| CSWJ |
WORD QUANTITY (NON-CORE) |
8192 |
| SPCL |
SPECIAL TEST FEATURES |
RADIATION ACCEPTANCE TEST |
| AGAV |
END ITEM IDENTIFICATION |
PACER SPECIAL |
| CQSJ |
INCLOSURE MATERIAL |
CERAMIC |
| CRHL |
BIT QUANTITY (NON-CORE) |
65336 |
| ADAQ |
BODY LENGTH |
0.540 INCHES MINIMUM AND 0.560 INCHES MAXIMUM |
| TEST |
TEST DATA DOCUMENT |
96906-MIL-STD-883 STANDARD |
| CQSZ |
INCLOSURE CONFIGURATION |
LEADLESS FLAT PACK |
| ADAT |
BODY WIDTH |
0.438 INCHES MINIMUM AND 0.458 INCHES MAXIMUM |
| CQWX |
OUTPUT LOGIC FORM |
N-TYPE METAL OXIDE-SEMICONDUCTOR LOGIC |
| CRTL |
CRITICALITY CODE JUSTIFICATION |
FEAT |
| CZEQ |
TIME RATING PER CHACTERISTIC |
250.00 NANOSECONDS MAXIMUM ACCESS |
| ADAU |
BODY HEIGHT |
0.100 INCHES MINIMUM AND 0.120 INCHES MAXIMUM |
| CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |
| CZEN |
VOLTAGE RATING AND TYPE PER CHARACTERISTIC |
-0.3 VOLTS MINIMUM TOTAL SUPPLY AND 6.0 VOLTS MAXIMUM TOTAL SUPPLY |
| CZER |
MEMORY DEVICE TYPE |
EEPROM |