| CQSZ |
INCLOSURE CONFIGURATION |
DUAL-IN-LINE |
| AFGA |
OPERATING TEMP RANGE |
-55.0/+125.0 DEG CELSIUS |
| CZER |
MEMORY DEVICE TYPE |
EPROM |
| CXCY |
PART NAME ASSIGNED BY CONTROLLING AGENCY |
MICROCIRCUIT,PROGRAMMED |
| CQZP |
INPUT CIRCUIT PATTERN |
24 INPUT |
| TTQY |
TERMINAL TYPE AND QUANTITY |
28 PRINTED CIRCUIT |
| CSWJ |
WORD QUANTITY (NON-CORE) |
65536 |
| ADAT |
BODY WIDTH |
0.600 INCHES MINIMUM AND 0.620 INCHES MAXIMUM |
| CRHL |
BIT QUANTITY (NON-CORE) |
524288 |
| CZEN |
VOLTAGE RATING AND TYPE PER CHARACTERISTIC |
-0.6 VOLTS MINIMUM TOTAL SUPPLY AND 6.2 VOLTS MAXIMUM TOTAL SUPPLY |
| CZEQ |
TIME RATING PER CHACTERISTIC |
250.00 NANOSECONDS NOMINAL ACCESS |
| AEHX |
MAXIMUM POWER DISSIPATION RATING |
350.0 MILLIWATTS |
| CBBL |
FEATURES PROVIDED |
PROGRAMMED AND ULTRAVIOLET ERASABLE AND MONOLITHIC AND ELECTROSTATIC SENSITIVE |
| ADAQ |
BODY LENGTH |
1.480 INCHES MINIMUM AND 1.500 INCHES MAXIMUM |
| AFJQ |
STORAGE TEMP RANGE |
-65.0/+150.0 DEG CELSIUS |
| CTFT |
CASE OUTLINE SOURCE AND DESIGNATOR |
D-10 MIL-M-38510 |
| ADAU |
BODY HEIGHT |
0.212 INCHES MINIMUM AND 0.242 INCHES MAXIMUM |
| CQSJ |
INCLOSURE MATERIAL |
CERAMIC |
| AGAV |
END ITEM IDENTIFICATION |
EO LOROPS |
| CQWX |
OUTPUT LOGIC FORM |
COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
| TEST |
TEST DATA DOCUMENT |
96906-MIL-STD-883 STANDARD |
| CRTL |
CRITICALITY CODE JUSTIFICATION |
FEAT |
| FEAT |
SPECIAL FEATURES |
ESD;ALTERED ITEM PROGRAMMED USING 67268/5962-8764803XX USING FILE 13691034.JED |
| CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |