| TEST |
TEST DATA DOCUMENT |
95105-995-9501-020 SPECIFICATION AND 81349-MIL-M-38510 SPECIFICATION AND 81349-MIL-I-38535 SPECIFICATION AND 96906-MIL-STD-480 STANDARD AND 96906-MIL-STD-883 STANDARD |
| CQSZ |
INCLOSURE CONFIGURATION |
DUAL-IN-LINE |
| AFGA |
OPERATING TEMP RANGE |
-55.0/+125.0 DEG CELSIUS |
| CRHL |
BIT QUANTITY (NON-CORE) |
128 |
| NHCF |
NUCLEAR HARDNESS CRITICAL FEATURE |
HARDENED |
| CXCY |
PART NAME ASSIGNED BY CONTROLLING AGENCY |
RESCREENED,MICROCIRCUIT,DIGITAL,MICROCOMPUTER |
| ZZZT |
NONDEFINITIVE SPEC/STD DATA |
A FINISH AND 01 TYPE AND M CLASS AND Q CASE AND 010 NUMBER |
| AFJQ |
STORAGE TEMP RANGE |
-65.0/+150.0 DEG CELSIUS |
| CSWJ |
WORD QUANTITY (NON-CORE) |
16 |
| CSSL |
DESIGN FUNCTION AND QUANTITY |
1 MICROCOMPUTER |
| AEHX |
MAXIMUM POWER DISSIPATION RATING |
200.0 MILLIWATTS |
| SPCL |
SPECIAL TEST FEATURES |
RESCREENED FOR MILSTAR |
| CQSJ |
INCLOSURE MATERIAL |
CERAMIC |
| CZEN |
VOLTAGE RATING AND TYPE PER CHARACTERISTIC |
6.0 VOLTS MAXIMUM POSITIVE POWER SUPPLY SPAN AND 4.0 VOLTS MINIMUM POSITIVE POWER SUPPLY SPAN AND 6.5 VOLTS MAXIMUM REFERENCE |
| CQWX |
OUTPUT LOGIC FORM |
COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
| CTFT |
CASE OUTLINE SOURCE AND DESIGNATOR |
D-5 MIL-M-38510 |
| ZZZX |
DEPARTURE FROM CITED DESIGNATOR |
RESCREENED |
| ZZZK |
SPECIFICATION/STANDARD DATA |
67268-85064 GOVERNMENT STANDARD AND 95105-RC258-0208 MANUFACTURERS SOURCE CONTROL |
| TTQY |
TERMINAL TYPE AND QUANTITY |
40 PRINTED CIRCUIT |
| CBBL |
FEATURES PROVIDED |
RADIATION HARDENED |
| CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |