| AGAV |
END ITEM IDENTIFICATION |
AN/FPS-124 |
| CQSZ |
INCLOSURE CONFIGURATION |
DUAL-IN-LINE |
| AFGA |
OPERATING TEMP RANGE |
-55.0/+125.0 DEG CELSIUS |
| TEST |
TEST DATA DOCUMENT |
81349-MIL-M-38510 SPECIFICATION AND 96906-MIL-STD-883 STANDARD |
| CBBL |
FEATURES PROVIDED |
SCHOTTKY AND BIPOLAR |
| CTFT |
CASE OUTLINE SOURCE AND DESIGNATOR |
D-8 MIL-M-38510 |
| CTQX |
CURRENT RATING PER CHARACTERISTIC |
-30.00 MILLIAMPERES COLLECTOR CUTOFF CURRENT, DC, BASE OPEN ABSOLUTE AND 5.00 MILLIAMPERES AVERAGE FORWARD CURRENT AVERAGED OVER A FULL 60-HZ CYCLE ABSOLUTE |
| TTQY |
TERMINAL TYPE AND QUANTITY |
20 PRINTED CIRCUIT |
| CXCY |
PART NAME ASSIGNED BY CONTROLLING AGENCY |
MICROCIRCUIT,DIGTAL,SCHOTTKY,BIPOLAR 4096 PROM |
| CZEN |
VOLTAGE RATING AND TYPE PER CHARACTERISTIC |
-0.5 VOLTS MINIMUM TOTAL SUPPLY AND 7.0 VOLTS MAXIMUM TOTAL SUPPLY |
| AFJQ |
STORAGE TEMP RANGE |
-65.0/+150.0 DEG CELSIUS |
| CQWX |
OUTPUT LOGIC FORM |
BIPOLAR METAL-OXIDE SEMICONDUCTOR |
| AEHX |
MAXIMUM POWER DISSIPATION RATING |
880.0 MILLIWATTS |
| CQSJ |
INCLOSURE MATERIAL |
CERAMIC |
| ZZZK |
SPECIFICATION/STANDARD DATA |
67268-5962-8769002RS GOVERNMENT STANDARD AND 56232-1219251-214 MANUFACTURERS SOURCE CONTROL |
| CRHL |
BIT QUANTITY (NON-CORE) |
4096 |
| CZER |
MEMORY DEVICE TYPE |
PROM |
| CZEQ |
TIME RATING PER CHACTERISTIC |
45.00 NANOSECONDS NOMINAL ACCESS |
| ZZZX |
DEPARTURE FROM CITED DESIGNATOR |
ALTERED BY PROGRAMMING,MARKING & TESTING |
| CZES |
HYBRID TECHNOLOGY TYPE |
MONOLITHIC |
| CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |