| CQSZ |
INCLOSURE CONFIGURATION |
DUAL-IN-LINE |
| AFGA |
OPERATING TEMP RANGE |
-55.0/+125.0 DEG CELSIUS |
| CZZZ |
MEMORY CAPACITY |
16384 X 2048 |
| ZZZK |
SPECIFICATION/STANDARD DATA |
95105-210-2155-010 MANUFACTURERS SPECIFICATION CONTROL |
| NHCF |
NUCLEAR HARDNESS CRITICAL FEATURE |
HARDENED |
| CZEN |
VOLTAGE RATING AND TYPE PER CHARACTERISTIC |
-0.5 VOLTS MINIMUM TOTAL SUPPLY AND 5.5 VOLTS MAXIMUM TOTAL SUPPLY |
| FEAT |
SPECIAL FEATURES |
ELECTROSTATIC DISCHARGE SENS/HARDNESS CRITICAL ITEM; ALTERED ITEM PROGRAMMED (USING 34335/AM27S45/BLA) USING FILE TPMU9.HEX WITH CHECKSUM F0F6 |
| CQZP |
INPUT CIRCUIT PATTERN |
14 INPUT |
| TTQY |
TERMINAL TYPE AND QUANTITY |
24 PRINTED CIRCUIT |
| CXCY |
PART NAME ASSIGNED BY CONTROLLING AGENCY |
INTEGRATED CIRCUIT-MODIFIED TRANSEC MICROCODE |
| AFJQ |
STORAGE TEMP RANGE |
-65.0/+150.0 DEG CELSIUS |
| CTFT |
CASE OUTLINE SOURCE AND DESIGNATOR |
D-9 MIL-M-38510 |
| AGAV |
END ITEM IDENTIFICATION |
PACER SPECIAL |
| CQSJ |
INCLOSURE MATERIAL |
CERAMIC |
| ADAT |
BODY WIDTH |
0.290 INCHES MINIMUM AND 0.320 INCHES MAXIMUM |
| CBBL |
FEATURES PROVIDED |
ELECTROSTATIC SENSITIVE AND TESTED TO MIL-STD-883 AND PROGRAMMABLE AND 3-STATE OUTPUT AND SCHOTTKY AND BURN IN, MIL-STD-883, CLASS B AND HERMETICALLY SEALED |
| CQWX |
OUTPUT LOGIC FORM |
TRANSISTOR-TRANSISTOR LOGIC |
| CZER |
MEMORY DEVICE TYPE |
PROM |
| TEST |
TEST DATA DOCUMENT |
96906-MIL-STD-883 STANDARD |
| ADAQ |
BODY LENGTH |
1.270 INCHES MINIMUM AND 1.290 INCHES MAXIMUM |
| ADAU |
BODY HEIGHT |
0.180 INCHES MINIMUM AND 0.225 INCHES MAXIMUM |
| CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |