| CQSZ |
INCLOSURE CONFIGURATION |
DUAL-IN-LINE |
| AFGA |
OPERATING TEMP RANGE |
-55.0/+125.0 DEG CELSIUS |
| AGAV |
END ITEM IDENTIFICATION |
CONVERTSIGNDA E/I FSCM 72314 |
| CBBL |
FEATURES PROVIDED |
PROGRAMMED AND ULTRAVIOLET ERASABLE |
| CZEQ |
TIME RATING PER CHACTERISTIC |
40.00 NANOSECONDS NOMINAL ACCESS |
| TTQY |
TERMINAL TYPE AND QUANTITY |
24 PRINTED CIRCUIT |
| AFJQ |
STORAGE TEMP RANGE |
-65.0/+150.0 DEG CELSIUS |
| CTFT |
CASE OUTLINE SOURCE AND DESIGNATOR |
D-9 MIL-M-38510 |
| CZER |
MEMORY DEVICE TYPE |
PAL |
| CQSJ |
INCLOSURE MATERIAL |
CERAMIC |
| ZZZP |
PURCHASE DESCRIPTION IDENTIFICATION |
72314-1280PALC22V10-3 |
| AEHX |
MAXIMUM POWER DISSIPATION RATING |
1.2 WATTS |
| CZEN |
VOLTAGE RATING AND TYPE PER CHARACTERISTIC |
-2.0 VOLTS MINIMUM ABSOLUTE INPUT AND 7.0 VOLTS MAXIMUM ABSOLUTE INPUT |
| CQWX |
OUTPUT LOGIC FORM |
COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
| ZZZK |
SPECIFICATION/STANDARD DATA |
67268-5962-8753903LA GOVERNMENT STANDARD |
| CXCY |
PART NAME ASSIGNED BY CONTROLLING AGENCY |
MICROCIRCUIT,MEMORY,CMOS UV ERASABLE,PROGRAMMABLE ARRAY LOGIC,MONOLITHIC |
| TEST |
TEST DATA DOCUMENT |
81349-MIL--38510 SPECIFICATION AND 96906-MIL-STD-883 STANDARD |
| CZES |
HYBRID TECHNOLOGY TYPE |
MONOLITHIC |
| ZZZX |
DEPARTURE FROM CITED DESIGNATOR |
ALTERED BY PROGRAMMING,TESTING & MARKING |
| CQZP |
INPUT CIRCUIT PATTERN |
22 INPUT |
| CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |