| AFGA |
OPERATING TEMP RANGE |
-55.0/+125.0 DEG CELSIUS |
| NHCF |
NUCLEAR HARDNESS CRITICAL FEATURE |
HARDENED |
| TTQY |
TERMINAL TYPE AND QUANTITY |
28 PRINTED CIRCUIT |
| CTFT |
CASE OUTLINE SOURCE AND DESIGNATOR |
C-11 MIL-M-38510 |
| ZZZK |
SPECIFICATION/STANDARD DATA |
67268-5962-8866203UA GOVERNMENT STANDARD |
| AEHX |
MAXIMUM POWER DISSIPATION RATING |
1.0 WATTS |
| CXCY |
PART NAME ASSIGNED BY CONTROLLING AGENCY |
MICROCIRCUIT,SRAM,32K X 8(CY7C197) |
| AFJQ |
STORAGE TEMP RANGE |
-65.0/+150.0 DEG CELSIUS |
| ZZZP |
PURCHASE DESCRIPTION IDENTIFICATION |
11293-15-1326285-1 |
| CQSJ |
INCLOSURE MATERIAL |
CERAMIC |
| CZEQ |
TIME RATING PER CHACTERISTIC |
55.00 NANOSECONDS NOMINAL ACCESS |
| CQSZ |
INCLOSURE CONFIGURATION |
LEADED CHIP CARRIER |
| CZZZ |
MEMORY CAPACITY |
128KX8 |
| CQWX |
OUTPUT LOGIC FORM |
COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
| FEAT |
SPECIAL FEATURES |
CBBL |
| CZER |
MEMORY DEVICE TYPE |
RAM |
| CRHL |
BIT QUANTITY (NON-CORE) |
262144 |
| TEST |
TEST DATA DOCUMENT |
96906-MIL-STD-883 STANDARD AND 81349-MIL-M-38510 SPECIFICATION AND 11293-00-1326100 DRAWING |
| AGAV |
END ITEM IDENTIFICATION |
HAC/RMPE REAC E/I FSCM 11293 |
| CBBL |
FEATURES PROVIDED |
RADIATION HARDENED AND ELECTROSTATIC SENSITIVE |
| CRTL |
CRITICALITY CODE JUSTIFICATION |
FEAT |
| CZES |
HYBRID TECHNOLOGY TYPE |
MONOLITHIC |
| CZEN |
VOLTAGE RATING AND TYPE PER CHARACTERISTIC |
-0.5 VOLTS MINIMUM INPUT AND 6.0 VOLTS MAXIMUM INPUT |
| ZZZX |
DEPARTURE FROM CITED DESIGNATOR |
MODIFIED FOR NUCLEAR HARDNESS IMPACT |
| CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |