| CQSZ |
INCLOSURE CONFIGURATION |
DUAL-IN-LINE |
| AFGA |
OPERATING TEMP RANGE |
-55.0/+125.0 DEG CELSIUS |
| CBBL |
FEATURES PROVIDED |
SCHOTTKY AND RADIATION HARDENED AND MONOLITHIC AND ELECTROSTATIC SENSITIVE AND LOW POWER AND BURN IN, MIL-STD-883, CLASS B AND HERMETICALLY SEALED AND TESTED TO MIL-STD-883 |
| FEAT |
SPECIAL FEATURES |
HCI,ESD,THIS ITEM IS QPL FOR 81349-M38510/37401BCA |
| CXCY |
PART NAME ASSIGNED BY CONTROLLING AGENCY |
MICROCIRCUIT,DIGITAL,AND GATE,QUAD,2 INPUT |
| NHCF |
NUCLEAR HARDNESS CRITICAL FEATURE |
HARDENED |
| ADAT |
BODY WIDTH |
0.180 INCHES MINIMUM AND 0.200 INCHES MAXIMUM |
| TTQY |
TERMINAL TYPE AND QUANTITY |
14 PRINTED CIRCUIT |
| CTFT |
CASE OUTLINE SOURCE AND DESIGNATOR |
D-1 MIL-M-38510 |
| AGAV |
END ITEM IDENTIFICATION |
MILSTAR |
| AFJQ |
STORAGE TEMP RANGE |
-65.0/+150.0 DEG CELSIUS |
| CSSL |
DESIGN FUNCTION AND QUANTITY |
4 GATE, AND |
| ADAU |
BODY HEIGHT |
0.290 INCHES MINIMUM AND 0.310 INCHES MAXIMUM |
| CQSJ |
INCLOSURE MATERIAL |
CERAMIC |
| CZEQ |
TIME RATING PER CHACTERISTIC |
4.00 NANOSECONDS MINIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 3.00 NANOSECONDS MINIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT AND 12.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT AND 16.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT |
| ADAQ |
BODY LENGTH |
0.765 INCHES MINIMUM AND 0.785 INCHES MAXIMUM |
| CZEN |
VOLTAGE RATING AND TYPE PER CHARACTERISTIC |
4.5 VOLTS MINIMUM TOTAL SUPPLY AND 5.5 VOLTS MAXIMUM TOTAL SUPPLY |
| CQWX |
OUTPUT LOGIC FORM |
TRANSISTOR-TRANSISTOR LOGIC |
| CQZP |
INPUT CIRCUIT PATTERN |
QUAD 2 INPUT |
| AEHX |
MAXIMUM POWER DISSIPATION RATING |
22.0 MILLIWATTS |
| TEST |
TEST DATA DOCUMENT |
96906-MIL-STD-833 STANDARD |
| CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |