| CQSZ |
INCLOSURE CONFIGURATION |
DUAL-IN-LINE |
| CZEQ |
TIME RATING PER CHACTERISTIC |
55.00 NANOSECONDS MAXIMUM ACCESS |
| AFGA |
OPERATING TEMP RANGE |
-55.0/+125.0 DEG CELSIUS |
| NHCF |
NUCLEAR HARDNESS CRITICAL FEATURE |
HARDENED |
| CZEN |
VOLTAGE RATING AND TYPE PER CHARACTERISTIC |
0.0 VOLTS MINIMUM TOTAL SUPPLY AND 7.0 VOLTS MAXIMUM TOTAL SUPPLY |
| CTFT |
CASE OUTLINE SOURCE AND DESIGNATOR |
D-3 MIL-M-38510 |
| TTQY |
TERMINAL TYPE AND QUANTITY |
24 PRINTED CIRCUIT |
| AFJQ |
STORAGE TEMP RANGE |
-65.0/+150.0 DEG CELSIUS |
| FEAT |
SPECIAL FEATURES |
ESD; ALTERED ITEM PROGRAMMED (USING 34335/AM27S43A/BJA OR 18234/82HS321A/BJA OR MMI/53S3281AJ/883B) USING FILE MPMU20.HEX WITH CHECKSUM 2170. CRIT CODE CHG (H) PER ES LONNELL MAY 01/06 |
| ADAU |
BODY HEIGHT |
0.205 INCHES MINIMUM AND 0.225 INCHES MAXIMUM |
| AGAV |
END ITEM IDENTIFICATION |
PACER SPECIAL |
| CQSJ |
INCLOSURE MATERIAL |
CERAMIC |
| CXCY |
PART NAME ASSIGNED BY CONTROLLING AGENCY |
MICROCIRCUIT,DIGITAL,MEMORY |
| ADAT |
BODY WIDTH |
0.590 INCHES MINIMUM AND 0.610 INCHES MAXIMUM |
| CQWX |
OUTPUT LOGIC FORM |
TRANSISTOR-TRANSISTOR LOGIC |
| CBBL |
FEATURES PROVIDED |
ELECTROSTATIC SENSITIVE AND HIGH SPEED AND HERMETICALLY SEALED AND BURN IN, MIL-STD-883, CLASS B AND PROGRAMMED AND TESTED TO MIL-STD-883 AND 3-STATE OUTPUT |
| CZER |
MEMORY DEVICE TYPE |
PROM |
| TEST |
TEST DATA DOCUMENT |
96906-MIL-STD-883 STANDARD |
| ADAQ |
BODY LENGTH |
1.270 INCHES MINIMUM AND 1.290 INCHES MAXIMUM |
| ZZZK |
SPECIFICATION/STANDARD DATA |
95105-210-2104-010 MANUFACTURERS SPECIFICATION CONTROL |
| CZZZ |
MEMORY CAPACITY |
32768 X 4096 |
| CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |