| CQSZ |
INCLOSURE CONFIGURATION |
DUAL-IN-LINE |
| AFGA |
OPERATING TEMP RANGE |
-55.0/+125.0 DEG CELSIUS |
| CZEP |
CAPITANCE RATING PER CHARACTERISTIC |
5.00 INPUT PICOFARADS NOMINAL AND 7.00 OUTPUT PICOFARADS NOMINAL |
| CXCY |
PART NAME ASSIGNED BY CONTROLLING AGENCY |
RAMS (SCRAMS) |
| AEHX |
MAXIMUM POWER DISSIPATION RATING |
1.0 WATTS |
| CBBL |
FEATURES PROVIDED |
STATIC OPERATION AND HIGH SPEED AND HIGH PERFORMANCE AND W/DISABLE AND W/ENABLE AND HIGH IMPEDANCE AND HERMETICALLY SEALED |
| CQZP |
INPUT CIRCUIT PATTERN |
15 INPUT |
| ADAQ |
BODY LENGTH |
0.860 INCHES MINIMUM AND 0.960 INCHES MAXIMUM |
| AFJQ |
STORAGE TEMP RANGE |
-65.0/+150.0 DEG CELSIUS |
| CZEN |
VOLTAGE RATING AND TYPE PER CHARACTERISTIC |
-0.5 VOLTS MINIMUM POWER SOURCE AND 7.0 VOLTS MAXIMUM POWER SOURCE |
| CQSJ |
INCLOSURE MATERIAL |
CERAMIC |
| ADAU |
BODY HEIGHT |
0.020 INCHES MINIMUM AND 0.185 INCHES MAXIMUM |
| CSWJ |
WORD QUANTITY (NON-CORE) |
4096 |
| CZEQ |
TIME RATING PER CHACTERISTIC |
15.00 NANOSECONDS MAXIMUM ACCESS |
| CRHL |
BIT QUANTITY (NON-CORE) |
4096 |
| CQWX |
OUTPUT LOGIC FORM |
COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
| TEST |
TEST DATA DOCUMENT |
96906-MIL-STD-883 STANDARD |
| CZER |
MEMORY DEVICE TYPE |
RAM |
| ADAT |
BODY WIDTH |
0.220 INCHES MINIMUM AND 0.310 INCHES MAXIMUM |
| CTQX |
CURRENT RATING PER CHARACTERISTIC |
120.00 MILLIAMPERES REVERSE CURRENT, DC MICROAMPERES |
| TTQY |
TERMINAL TYPE AND QUANTITY |
18 PRINTED CIRCUIT |
| CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |