| CQSZ |
INCLOSURE CONFIGURATION |
DUAL-IN-LINE |
| AFGA |
OPERATING TEMP RANGE |
-55.0/+125.0 DEG CELSIUS |
| NHCF |
NUCLEAR HARDNESS CRITICAL FEATURE |
HARDENED |
| TTQY |
TERMINAL TYPE AND QUANTITY |
14 PRINTED CIRCUIT |
| ZZZK |
SPECIFICATION/STANDARD DATA |
81349-MIL-M-38510/370 GOVERNMENT SPECIFICATION |
| CTFT |
CASE OUTLINE SOURCE AND DESIGNATOR |
D-1 MIL-M-38510 |
| CBBL |
FEATURES PROVIDED |
LOW POWER AND 2-STATE OUTPUT AND HERMETICALLY SEALED AND RADIATION HARDENED AND ELECTROSTATIC SENSITIVE AND MONOLITHIC AND BURN IN, MIL-STD-883, CLASS B AND SCHOTTKY AND TESTED TO MIL-STD-883 |
| AFJQ |
STORAGE TEMP RANGE |
-65.0/+150.0 DEG CELSIUS |
| ADAT |
BODY WIDTH |
0.290 INCHES MINIMUM AND 0.310 INCHES MAXIMUM |
| CTQX |
CURRENT RATING PER CHARACTERISTIC |
15.00 MILLIAMPERES MINIMUM OUTPUT AND 110.00 MILLIAMPERES MAXIMUM OUTPUT |
| CXCY |
PART NAME ASSIGNED BY CONTROLLING AGENCY |
MICROCIRCUIT,DIGITAL,NAND GATE,QUAD,2 INPUT |
| CQSJ |
INCLOSURE MATERIAL |
CERAMIC |
| ADAQ |
BODY LENGTH |
0.765 INCHES MINIMUM AND 0.785 INCHES MAXIMUM |
| CZEN |
VOLTAGE RATING AND TYPE PER CHARACTERISTIC |
4.5 VOLTS MINIMUM TOTAL SUPPLY AND 5.5 VOLTS MAXIMUM TOTAL SUPPLY |
| CQWX |
OUTPUT LOGIC FORM |
TRANSISTOR-TRANSISTOR LOGIC |
| FEAT |
SPECIAL FEATURES |
HCI;ESD,HERMATICALLY SEALED |
| CQZP |
INPUT CIRCUIT PATTERN |
QUAD 2 INPUT |
| AEHX |
MAXIMUM POWER DISSIPATION RATING |
16.4 MILLIWATTS |
| TEST |
TEST DATA DOCUMENT |
96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
| CRTL |
CRITICALITY CODE JUSTIFICATION |
FEAT |
| CZEQ |
TIME RATING PER CHACTERISTIC |
3.00 NANOSECONDS MINIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 14.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT |
| ADAU |
BODY HEIGHT |
0.180 INCHES MINIMUM AND 0.200 INCHES MAXIMUM |
| CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |
| CSSL |
DESIGN FUNCTION AND QUANTITY |
4 GATE, NAND |