| CQSZ |
INCLOSURE CONFIGURATION |
DUAL-IN-LINE |
| AFGA |
OPERATING TEMP RANGE |
-55.0/+125.0 DEG CELSIUS |
| CXCY |
PART NAME ASSIGNED BY CONTROLLING AGENCY |
MICROCIRCUIT,PROGRAMMED |
| CTFT |
CASE OUTLINE SOURCE AND DESIGNATOR |
D-8 MIL-M-38510 |
| TTQY |
TERMINAL TYPE AND QUANTITY |
20 PRINTED CIRCUIT |
| FEAT |
SPECIAL FEATURES |
ELECTROSTATIC DISCHARGE SENSITIVE; ALTERED ITEM,MAKE FROM DEVICE 5962-8867812RA,PROGRAM TO 1062-U12.JED,FD137200055-001,CHECKSUM 6180; NHA PN 1372AE1062 |
| CBBL |
FEATURES PROVIDED |
HERMETICALLY SEALED AND PROGRAMMED AND MONOLITHIC AND BURN IN AND ULTRAVIOLET ERASABLE |
| AFJQ |
STORAGE TEMP RANGE |
-65.0/+150.0 DEG CELSIUS |
| CZEN |
VOLTAGE RATING AND TYPE PER CHARACTERISTIC |
-0.5 VOLTS MINIMUM POWER SOURCE AND 7.0 VOLTS MAXIMUM POWER SOURCE |
| ADAT |
BODY WIDTH |
0.290 INCHES MINIMUM AND 0.310 INCHES MAXIMUM |
| CQSJ |
INCLOSURE MATERIAL |
CERAMIC |
| ADAQ |
BODY LENGTH |
1.040 INCHES MINIMUM AND 1.060 INCHES MAXIMUM |
| CQZP |
INPUT CIRCUIT PATTERN |
16 INPUT |
| AGAV |
END ITEM IDENTIFICATION |
EO LOROPS |
| CQWX |
OUTPUT LOGIC FORM |
COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
| TEST |
TEST DATA DOCUMENT |
96906-MIL-STD-883 STANDARD |
| CZEQ |
TIME RATING PER CHACTERISTIC |
40.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT AND 40.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT |
| CSSL |
DESIGN FUNCTION AND QUANTITY |
1 ARRAY, LOGIC |
| CRTL |
CRITICALITY CODE JUSTIFICATION |
FEAT |
| ADAU |
BODY HEIGHT |
0.180 INCHES MINIMUM AND 0.200 INCHES MAXIMUM |
| CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |