| AFGA |
OPERATING TEMP RANGE |
-55.0/+125.0 DEG CELSIUS |
| TEST |
TEST DATA DOCUMENT |
81349-MIL-M-38510 SPECIFICATION AND 96906-MIL-STD-883 STANDARD |
| CXCY |
PART NAME ASSIGNED BY CONTROLLING AGENCY |
MICROCIRCUIT MEMORY,16-INPUT 8OUTPUT REGISTERED AND-OR GATE ARRAY |
| FEAT |
SPECIAL FEATURES |
NUCLEAR HARDNESS CRITICAL ITEM |
| AEHX |
MAXIMUM POWER DISSIPATION RATING |
0.6 WATTS |
| TTQY |
TERMINAL TYPE AND QUANTITY |
20 PRINTED CIRCUIT |
| CQSZ |
INCLOSURE CONFIGURATION |
FLAT PACK |
| CZEN |
VOLTAGE RATING AND TYPE PER CHARACTERISTIC |
-0.5 VOLTS MINIMUM TOTAL SUPPLY AND 7.0 VOLTS MAXIMUM TOTAL SUPPLY |
| AFJQ |
STORAGE TEMP RANGE |
-65.0/+150.0 DEG CELSIUS |
| CBBL |
FEATURES PROVIDED |
BIPOLAR AND PROGRAMMED AND RADIATION HARDENED |
| CZER |
MEMORY DEVICE TYPE |
PAL |
| ZZZK |
SPECIFICATION/STANDARD DATA |
67268-5962-8515506SA GOVERNMENT STANDARD AND 03640-123A882-8 MANUFACTURERS SOURCE CONTROL |
| CQSJ |
INCLOSURE MATERIAL |
CERAMIC |
| CTQX |
CURRENT RATING PER CHARACTERISTIC |
-2.00 MILLIAMPERES FORWARD CURRENT, DC UNIVERSAL AND 12.00 MILLIAMPERES FORWARD CURRENT, DC MEGAWATTS |
| CQZP |
INPUT CIRCUIT PATTERN |
16 INPUT |
| CQWX |
OUTPUT LOGIC FORM |
COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
| CRTL |
CRITICALITY CODE JUSTIFICATION |
FEAT |
| CZES |
HYBRID TECHNOLOGY TYPE |
MONOLITHIC |
| ZZZX |
DEPARTURE FROM CITED DESIGNATOR |
ALTERED BY PROGRAMMING,TESTING & MARKING |
| AGAV |
END ITEM IDENTIFICATION |
VALVE-SELECTI E/I FSCM 70339 |
| CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |
| CTFT |
CASE OUTLINE SOURCE AND DESIGNATOR |
F-9 MIL-M-38510 |