| CQSZ |
INCLOSURE CONFIGURATION |
DUAL-IN-LINE |
| AFGA |
OPERATING TEMP RANGE |
-55.0/+125.0 DEG CELSIUS |
| CSSL |
DESIGN FUNCTION AND QUANTITY |
2 FLIP-FLOP, D-TYPE |
| FEAT |
SPECIAL FEATURES |
ELECTROSTATIC DISCHARGE SENS/HARDNESS CRITICAL ITEM; SELECTED ITEM; REF P/N 5962-8752501XX,CAGE 67268; NHA P/N G317534 |
| TTQY |
TERMINAL TYPE AND QUANTITY |
14 PRINTED CIRCUIT |
| AEHX |
MAXIMUM POWER DISSIPATION RATING |
500.0 MILLIWATTS |
| CTFT |
CASE OUTLINE SOURCE AND DESIGNATOR |
D-1 MIL-M-38510 |
| AGAV |
END ITEM IDENTIFICATION |
MILSTAR |
| AFJQ |
STORAGE TEMP RANGE |
-65.0/+150.0 DEG CELSIUS |
| CXCY |
PART NAME ASSIGNED BY CONTROLLING AGENCY |
MICROCIRCUIT,DIGITAL,ADVANCED CMOS,DUAL,D-TYPE,FLIP-FLOP,MONOLITHIC SILICON |
| ADAT |
BODY WIDTH |
0.290 INCHES MINIMUM AND 0.310 INCHES MAXIMUM |
| CQSJ |
INCLOSURE MATERIAL |
CERAMIC |
| ADAQ |
BODY LENGTH |
0.765 INCHES MINIMUM AND 0.785 INCHES MAXIMUM |
| CQWX |
OUTPUT LOGIC FORM |
COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
| TEST |
TEST DATA DOCUMENT |
96906-MIL-STD-883 STANDARD |
| CRTL |
CRITICALITY CODE JUSTIFICATION |
FEAT |
| CBBL |
FEATURES PROVIDED |
RADIATION HARDENED AND SELECTED ITEM AND TESTED TO MIL-STD-883 AND BURN IN, MIL-STD-883, CLASS B AND W/CLEAR AND ELECTROSTATIC SENSITIVE AND W/PRESET AND MONOLITHIC |
| ADAU |
BODY HEIGHT |
0.180 INCHES MINIMUM AND 0.200 INCHES MAXIMUM |
| CZEN |
VOLTAGE RATING AND TYPE PER CHARACTERISTIC |
-0.5 VOLTS MINIMUM POWER SOURCE AND 6.0 VOLTS MAXIMUM POWER SOURCE |
| CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |