| CQSZ |
INCLOSURE CONFIGURATION |
DUAL-IN-LINE |
| AFGA |
OPERATING TEMP RANGE |
-55.0/+125.0 DEG CELSIUS |
| CRHL |
BIT QUANTITY (NON-CORE) |
8192 |
| CTFT |
CASE OUTLINE SOURCE AND DESIGNATOR |
D-3 MIL-M-38510 |
| FEAT |
SPECIAL FEATURES |
ALTERED ITEM PROGRAMMED USING DEVICE M38510/20904BJX;ESD |
| CQZP |
INPUT CIRCUIT PATTERN |
14 INPUT |
| TTQY |
TERMINAL TYPE AND QUANTITY |
24 PRINTED CIRCUIT |
| CZEN |
VOLTAGE RATING AND TYPE PER CHARACTERISTIC |
5.5 VOLTS MAXIMUM INPUT AND -0.5 VOLTS MINIMUM POWER SOURCE AND -1.5 VOLTS MINIMUM INPUT AND 7.0 VOLTS MAXIMUM POWER SOURCE |
| AEHX |
MAXIMUM POWER DISSIPATION RATING |
950.0 MILLIWATTS |
| AFJQ |
STORAGE TEMP RANGE |
-65.0/+150.0 DEG CELSIUS |
| ADAU |
BODY HEIGHT |
0.205 INCHES MINIMUM AND 0.225 INCHES MAXIMUM |
| CQSJ |
INCLOSURE MATERIAL |
CERAMIC |
| ADAT |
BODY WIDTH |
0.590 INCHES MINIMUM AND 0.610 INCHES MAXIMUM |
| AGAV |
END ITEM IDENTIFICATION |
AN/FPS-117 |
| CQWX |
OUTPUT LOGIC FORM |
TRANSISTOR-TRANSISTOR LOGIC |
| CTQX |
CURRENT RATING PER CHARACTERISTIC |
185.00 MILLIAMPERES REVERSE CURRENT, DC ABSOLUTE |
| CZER |
MEMORY DEVICE TYPE |
PROM |
| TEST |
TEST DATA DOCUMENT |
96906-MIL-STD-883 STANDARD |
| ADAQ |
BODY LENGTH |
1.270 INCHES MINIMUM AND 1.290 INCHES MAXIMUM |
| CRTL |
CRITICALITY CODE JUSTIFICATION |
FEAT |
| CBBL |
FEATURES PROVIDED |
3-STATE OUTPUT AND BIPOLAR AND MONOLITHIC AND PROGRAMMED AND TESTED TO MIL-STD-883 AND SCHOTTKY AND BURN IN, MIL-STD-883, CLASS B AND ELECTROSTATIC SENSITIVE AND HIGH IMPEDANCE AND W/ENABLE |
| CSWJ |
WORD QUANTITY (NON-CORE) |
1024 |
| CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |
| CXCY |
PART NAME ASSIGNED BY CONTROLLING AGENCY |
MICROCIRCUIT,DIGITAL,READ ONLY MEMORY |
| CZEQ |
TIME RATING PER CHACTERISTIC |
90.00 NANOSECONDS MAXIMUM INPUT TO OUTPUT ACCESS |