| CQSZ |
INCLOSURE CONFIGURATION |
DUAL-IN-LINE |
| AFGA |
OPERATING TEMP RANGE |
-55.0/+125.0 DEG CELSIUS |
| CXCY |
PART NAME ASSIGNED BY CONTROLLING AGENCY |
MICROCIRCUIT,DIGITAL,PAL,MEMORY AND I/O ADDRESS DECODE |
| AGAV |
END ITEM IDENTIFICATION |
PACER DAWN |
| TTQY |
TERMINAL TYPE AND QUANTITY |
24 PRINTED CIRCUIT |
| CTQX |
CURRENT RATING PER CHARACTERISTIC |
100.00 MILLIAMPERES REVERSE CURRENT, DC NOMINAL AND 210.00 MILLIAMPERES REVERSE CURRENT, DC ABSOLUTE AND 1.00 MILLIAMPERES REVERSE CURRENT, DC MICROAMPERES |
| AFJQ |
STORAGE TEMP RANGE |
-65.0/+150.0 DEG CELSIUS |
| CZER |
MEMORY DEVICE TYPE |
PAL |
| CZEN |
VOLTAGE RATING AND TYPE PER CHARACTERISTIC |
-0.5 VOLTS MINIMUM POWER SOURCE AND 12.0 VOLTS MAXIMUM INPUT AND -1.5 VOLTS MINIMUM INPUT AND 12.0 VOLTS MAXIMUM POWER SOURCE |
| CQSJ |
INCLOSURE MATERIAL |
CERAMIC |
| AEHX |
MAXIMUM POWER DISSIPATION RATING |
1.2 WATTS |
| FEAT |
SPECIAL FEATURES |
ESD;ALTERED ITEM FROM M38510/50501BLX USING PROGRAM INSTRUCTIONS PG6390000-01 |
| CQWX |
OUTPUT LOGIC FORM |
TRANSISTOR-TRANSISTOR LOGIC |
| TEST |
TEST DATA DOCUMENT |
96906-MIL-STD-883 STANDARD |
| CBBL |
FEATURES PROVIDED |
BIPOLAR AND MONOLITHIC AND ELECTROSTATIC SENSITIVE AND PROGRAMMED AND BURN IN, MIL-STD-883, CLASS B AND TESTED TO MIL-STD-883 |
| CQZP |
INPUT CIRCUIT PATTERN |
20 INPUT |
| CRTL |
CRITICALITY CODE JUSTIFICATION |
FEAT |
| CZEQ |
TIME RATING PER CHACTERISTIC |
30.00 NANOSECONDS MAXIMUM DELAY |
| CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |