| CQSZ |
INCLOSURE CONFIGURATION |
DUAL-IN-LINE |
| AFGA |
OPERATING TEMP RANGE |
-55.0/+125.0 DEG CELSIUS |
| CTQX |
CURRENT RATING PER CHARACTERISTIC |
1.00 MILLIAMPERES REVERSE CURRENT, DC MICROAMPERES AND 100.00 MILLIAMPERES REVERSE CURRENT, DC NOMINAL AND 210.00 MILLIAMPERES REVERSE CURRENT, DC ABSOLUTE |
| AGAV |
END ITEM IDENTIFICATION |
PACER DAWN |
| CZEN |
VOLTAGE RATING AND TYPE PER CHARACTERISTIC |
-0.5 VOLTS MINIMUM POWER SOURCE AND -1.5 VOLTS MINIMUM INPUT AND 5.5 VOLTS MAXIMUM INPUT AND 7.0 VOLTS MAXIMUM POWER SOURCE |
| TTQY |
TERMINAL TYPE AND QUANTITY |
24 PRINTED CIRCUIT |
| AFJQ |
STORAGE TEMP RANGE |
-65.0/+150.0 DEG CELSIUS |
| CXCY |
PART NAME ASSIGNED BY CONTROLLING AGENCY |
MICROCIRCUIT,DIGITAL,PAL,WAIT STATE GENERATOR |
| FEAT |
SPECIAL FEATURES |
ESD;ALTERED ITEM PROGRAMMED FROM 67268 5962-8767101LX USING PG639000-01 PROGRAM;CASE SIZE IS GDIP3-T24 OR CDIP4-T24 |
| CZER |
MEMORY DEVICE TYPE |
PAL |
| CQSJ |
INCLOSURE MATERIAL |
CERAMIC |
| AEHX |
MAXIMUM POWER DISSIPATION RATING |
1.2 WATTS |
| CQWX |
OUTPUT LOGIC FORM |
TRANSISTOR-TRANSISTOR LOGIC |
| CZEQ |
TIME RATING PER CHACTERISTIC |
20.00 NANOSECONDS MAXIMUM INPUT TO OUTPUT ACCESS |
| TEST |
TEST DATA DOCUMENT |
96906-MIL-STD-883 STANDARD |
| CQZP |
INPUT CIRCUIT PATTERN |
20 INPUT |
| CRTL |
CRITICALITY CODE JUSTIFICATION |
FEAT |
| CBBL |
FEATURES PROVIDED |
MONOLITHIC AND PROGRAMMED AND ELECTROSTATIC SENSITIVE AND HERMETICALLY SEALED AND BIPOLAR AND BURN IN, MIL-STD-883, CLASS B AND TESTED TO MIL-STD-883 |
| CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |