| CTQX |
CURRENT RATING PER CHARACTERISTIC |
20.00 MILLIAMPERES AVERAGE FORWARD CURRENT AVERAGED OVER A FULL 60-HZ CYCLE NOT APPLICABLE |
| CQSZ |
INCLOSURE CONFIGURATION |
DUAL-IN-LINE |
| AFGA |
OPERATING TEMP RANGE |
-55.0/+125.0 DEG CELSIUS |
| CZEQ |
TIME RATING PER CHACTERISTIC |
85.00 NANOSECONDS MAXIMUM ACCESS |
| CBBL |
FEATURES PROVIDED |
LOW POWER AND ELECTROSTATIC SENSITIVE AND STATIC OPERATION AND HIGH SPEED AND HIGH IMPEDANCE AND W/ENABLE |
| TTQY |
TERMINAL TYPE AND QUANTITY |
20 PRINTED CIRCUIT |
| AEHX |
MAXIMUM POWER DISSIPATION RATING |
1.0 WATTS |
| AFJQ |
STORAGE TEMP RANGE |
-65.0/+150.0 DEG CELSIUS |
| CZEN |
VOLTAGE RATING AND TYPE PER CHARACTERISTIC |
-0.5 VOLTS MINIMUM POWER SOURCE AND 7.0 VOLTS MAXIMUM POWER SOURCE |
| CQSJ |
INCLOSURE MATERIAL |
CERAMIC |
| CSWJ |
WORD QUANTITY (NON-CORE) |
16384 |
| ADAQ |
BODY LENGTH |
1.060 INCHES MAXIMUM |
| CRHL |
BIT QUANTITY (NON-CORE) |
16384 |
| CZEP |
CAPITANCE RATING PER CHARACTERISTIC |
5.00 INPUT PICOFARADS MAXIMUM AND 6.00 OUTPUT PICOFARADS MAXIMUM |
| CQZP |
INPUT CIRCUIT PATTERN |
17 INPUT |
| CQWX |
OUTPUT LOGIC FORM |
COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
| TEST |
TEST DATA DOCUMENT |
96906-MIL-STD-883 STANDARD |
| CZER |
MEMORY DEVICE TYPE |
RAM |
| ADAT |
BODY WIDTH |
0.220 INCHES MINIMUM AND 0.310 INCHES MAXIMUM |
| ADAU |
BODY HEIGHT |
0.185 INCHES MAXIMUM |
| CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |