| AFGA |
OPERATING TEMP RANGE |
-55.0/+125.0 DEG CELSIUS |
| CTQX |
CURRENT RATING PER CHARACTERISTIC |
80.00 MILLIAMPERES REVERSE CURRENT, DC ABSOLUTE |
| CZEQ |
TIME RATING PER CHACTERISTIC |
150.00 NANOSECONDS NOMINAL ACCESS AND 10.00 MILLISECONDS NOMINAL WRITE-CYCLE WIDTH |
| CZEN |
VOLTAGE RATING AND TYPE PER CHARACTERISTIC |
6.2 VOLTS MAXIMUM POWER SOURCE AND -0.3 VOLTS MINIMUM POWER SOURCE AND -0.3 VOLTS MINIMUM INPUT AND 6.2 VOLTS MAXIMUM INPUT |
| AGAV |
END ITEM IDENTIFICATION |
PACER DAWN |
| TTQY |
TERMINAL TYPE AND QUANTITY |
32 LEADLESS |
| CSWJ |
WORD QUANTITY (NON-CORE) |
32768 |
| AEHX |
MAXIMUM POWER DISSIPATION RATING |
1.0 WATTS |
| CTFT |
CASE OUTLINE SOURCE AND DESIGNATOR |
C-12 MIL-M-38510 |
| CZEP |
CAPITANCE RATING PER CHARACTERISTIC |
10.00 INPUT PICOFARADS MAXIMUM AND 10.00 OUTPUT PICOFARADS MAXIMUM |
| CRTL |
CRITICALITY CODE JUSTIFICATION |
CBBL |
| CBBL |
FEATURES PROVIDED |
BURN IN, MIL-STD-883, CLASS B AND ELECTRICALLY ALTERABLE AND PROGRAMMED AND MONOLITHIC AND ELECTROSTATIC SENSITIVE AND ERASABLE AND TESTED TO MIL-STD-883 |
| AFJQ |
STORAGE TEMP RANGE |
-65.0/+150.0 DEG CELSIUS |
| CQSJ |
INCLOSURE MATERIAL |
CERAMIC |
| ADAT |
BODY WIDTH |
0.442 INCHES MINIMUM AND 0.458 INCHES MAXIMUM |
| ADAQ |
BODY LENGTH |
0.540 INCHES MINIMUM AND 0.560 INCHES MAXIMUM |
| CQWX |
OUTPUT LOGIC FORM |
COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
| TEST |
TEST DATA DOCUMENT |
96906-MIL-STD-883 STANDARD |
| CQZP |
INPUT CIRCUIT PATTERN |
8 INPUT |
| CXCY |
PART NAME ASSIGNED BY CONTROLLING AGENCY |
MICROCIRCUIT, PROGRAMMED (EEPROM X28C256EMB-25 |
| CQSZ |
INCLOSURE CONFIGURATION |
LEADLESS FLAT PACK |
| CRHL |
BIT QUANTITY (NON-CORE) |
262144 |
| ADAU |
BODY HEIGHT |
0.060 INCHES MINIMUM AND 0.120 INCHES MAXIMUM |
| FEAT |
SPECIAL FEATURES |
ALTERED ITEM PROGRAMMED USING 67268 5962-8852506YA (WHICH IS 81349 M38510/26105BYA) USING PROGRAMMING INSTRUCTION 7554018P7 |
| CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |
| CZER |
MEMORY DEVICE TYPE |
EEPROM |