| AFGA |
OPERATING TEMP RANGE |
-55.0/+125.0 DEG CELSIUS |
| CQZP |
INPUT CIRCUIT PATTERN |
12 INPUT |
| CZEN |
VOLTAGE RATING AND TYPE PER CHARACTERISTIC |
7.0 VOLTS MAXIMUM POWER SOURCE AND -0.5 VOLTS MINIMUM POWER SOURCE AND -3.0 VOLTS MINIMUM INPUT AND 7.0 VOLTS MAXIMUM INPUT |
| AGAV |
END ITEM IDENTIFICATION |
PACER DAWN |
| AEHX |
MAXIMUM POWER DISSIPATION RATING |
1.0 WATTS |
| CZEP |
CAPITANCE RATING PER CHARACTERISTIC |
6.00 INPUT PICOFARADS MAXIMUM AND 8.00 OUTPUT PICOFARADS MAXIMUM |
| CRTL |
CRITICALITY CODE JUSTIFICATION |
CBBL |
| AFJQ |
STORAGE TEMP RANGE |
-65.0/+150.0 DEG CELSIUS |
| ADAQ |
BODY LENGTH |
0.442 INCHES MINIMUM AND 0.460 INCHES MAXIMUM |
| CTQX |
CURRENT RATING PER CHARACTERISTIC |
120.00 MILLIAMPERES REVERSE CURRENT, DC ABSOLUTE |
| CQSJ |
INCLOSURE MATERIAL |
CERAMIC |
| CTFT |
CASE OUTLINE SOURCE AND DESIGNATOR |
C-4 MIL-M-38510 |
| CXCY |
PART NAME ASSIGNED BY CONTROLLING AGENCY |
MICROCIRCUIT, PROGRAMMED (CY7C245-35) |
| CRHL |
BIT QUANTITY (NON-CORE) |
16384 |
| ADAT |
BODY WIDTH |
0.442 INCHES MINIMUM AND 0.460 INCHES MAXIMUM |
| CQWX |
OUTPUT LOGIC FORM |
COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
| CZER |
MEMORY DEVICE TYPE |
PROM |
| TEST |
TEST DATA DOCUMENT |
96906-MIL-STD-883 STANDARD |
| CQSZ |
INCLOSURE CONFIGURATION |
LEADLESS FLAT PACK |
| ADAU |
BODY HEIGHT |
0.060 INCHES MINIMUM AND 0.100 INCHES MAXIMUM |
| CSWJ |
WORD QUANTITY (NON-CORE) |
2048 |
| CZEQ |
TIME RATING PER CHACTERISTIC |
35.00 NANOSECONDS NOMINAL ACCESS |
| TTQY |
TERMINAL TYPE AND QUANTITY |
28 LEADLESS |
| CBBL |
FEATURES PROVIDED |
BURN IN, MIL-STD-883, CLASS B AND PROGRAMMED AND ELECTROSTATIC SENSITIVE AND MONOLITHIC AND TESTED TO MIL-STD-883 |
| CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |
| FEAT |
SPECIAL FEATURES |
ALTERED ITEM PROGRAMMED USING 67268 5962-88735033A USING PROGRAMMING INSTRUCTION 7816354P141 |