| AFGA |
OPERATING TEMP RANGE |
-55.0/+125.0 DEG CELSIUS |
| ABMK |
OVERALL WIDTH |
0.358 INCHES NOMINAL |
| AGAV |
END ITEM IDENTIFICATION |
PACER DAWN |
| CRTL |
CRITICALITY CODE JUSTIFICATION |
CBBL |
| SUPP |
SUPPLEMENTARY FEATURES |
MAXIMUM LOW LEVEL INPUT VOLTAGE 0.8VDC; MINIMUM HIGH LEVEL INPUT VOLTAGE 2.0 VDC; MINIMUM SETUP TIME, DN TO CP, HIGH OR LOW, DEVICE TYPE 01=2.5NS; 02=2.0 NS; MINIMUM HOLD TIME, DN TO CP, HIGH OR LOW, DEVICE TYPE 01=2.0 NS, =1.5 NS; MINIMUM CP PULSE WIDTH, HIGH OR LOW, DEVICE TYPE 01 = 7.0 NS, 02 = 6.0 NS |
| AFJQ |
STORAGE TEMP RANGE |
-65.0/+150.0 DEG CELSIUS |
| CSSL |
DESIGN FUNCTION AND QUANTITY |
REGISTER |
| ABKW |
OVERALL HEIGHT |
0.100 INCHES NOMINAL |
| CXCY |
PART NAME ASSIGNED BY CONTROLLING AGENCY |
MICROCIRCUIT, DIGITAL, FAST CMOS,OCTAL D REGISTER, MONOLITHIC SILICON |
| ABHP |
OVERALL LENGTH |
0.358 INCHES NOMINAL |
| CZEN |
VOLTAGE RATING AND TYPE PER CHARACTERISTIC |
4.5 VOLTS MINIMUM TOTAL SUPPLY AND 5.5 VOLTS MAXIMUM TOTAL SUPPLY |
| CQWX |
OUTPUT LOGIC FORM |
COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
| TEST |
TEST DATA DOCUMENT |
96906-MIL-STD-883 STANDARD |
| CQSJ |
INCLOSURE MATERIAL |
SILICON |
| CQSZ |
INCLOSURE CONFIGURATION |
LEADLESS FLAT PACK |
| CBBL |
FEATURES PROVIDED |
ELECTROSTATIC SENSITIVE AND BURN IN, MIL-STD-883, CLASS B AND COMPATIBLE CMOS AND TESTED TO MIL-STD-883 |
| TTQY |
TERMINAL TYPE AND QUANTITY |
20 LEADLESS |