| AFGA |
OPERATING TEMP RANGE |
-55.0/+125.0 DEG CELSIUS |
| CTQX |
CURRENT RATING PER CHARACTERISTIC |
1.00 MICROAMPERES FORWARD CURRENT, NONREPETITIVE, MAXIMUM PEAK TOTAL VALUE MICROAMPERES |
| TEST |
TEST DATA DOCUMENT |
96906-MIL-STD883 STANDARD |
| CXCY |
PART NAME ASSIGNED BY CONTROLLING AGENCY |
MICROCIRCUIT, DIGITAL, STANDARD CELL, 1553 SERIAL DIGITAL INTERFACE (SDI), MONOLITHIC SILICON |
| AGAV |
END ITEM IDENTIFICATION |
PACER DAWN |
| CTFT |
CASE OUTLINE SOURCE AND DESIGNATOR |
CMAGA3-+84 JOINT ELECTRON DEVICE ENGINEERING COUNCIL |
| CRTL |
CRITICALITY CODE JUSTIFICATION |
CBBL |
| CZEN |
VOLTAGE RATING AND TYPE PER CHARACTERISTIC |
-0.5 VOLTS MINIMUM TOTAL SUPPLY AND 7.0 VOLTS MAXIMUM TOTAL SUPPLY |
| AFJQ |
STORAGE TEMP RANGE |
-65.0/+150.0 DEG CELSIUS |
| CBBL |
FEATURES PROVIDED |
MONOLITHIC AND ELECTROSTATIC SENSITIVE AND TESTED TO MIL-STD-883 AND BURN IN |
| CQWX |
OUTPUT LOGIC FORM |
COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
| CQSZ |
INCLOSURE CONFIGURATION |
PIN GRID ARRAY |
| CSSL |
DESIGN FUNCTION AND QUANTITY |
1 CONTROL, INTERFACE |
| TTQY |
TERMINAL TYPE AND QUANTITY |
84 PIN |
| FEAT |
SPECIAL FEATURES |
TERMINAL FINISH GOLD PLATING 60 MICRO INCHES MIN THICKNESS OVER 100 MICRO INCHES (NONRECOVERABLE) |