| AFGA |
OPERATING TEMP RANGE |
-55.0/+125.0 DEG CELSIUS |
| CZEN |
VOLTAGE RATING AND TYPE PER CHARACTERISTIC |
-3.0 VOLTS MINIMUM INPUT AND 7.0 VOLTS MAXIMUM INPUT AND -0.5 VOLTS MINIMUM POWER SOURCE AND V7.0 VOLTS MINIMUM COMMERCIAL APPLIANCES - ICE CUBE MACHINES |
| ADAQ |
BODY LENGTH |
0.342 INCHES MINIMUM AND 0.358 INCHES MAXIMUM |
| AGAV |
END ITEM IDENTIFICATION |
PACER DAWN |
| AEHX |
MAXIMUM POWER DISSIPATION RATING |
1.0 WATTS |
| CBBL |
FEATURES PROVIDED |
PROGRAMMABLE AND MONOLITHIC AND BURN IN, MIL-STD-883, CLASS B AND ELECTROSTATIC SENSITIVE AND TESTED TO MIL-STD-883 |
| CRTL |
CRITICALITY CODE JUSTIFICATION |
CBBL |
| ADAT |
BODY WIDTH |
0.342 INCHES MINIMUM AND 0.358 INCHES MAXIMUM |
| CTQX |
CURRENT RATING PER CHARACTERISTIC |
24.00 MILLIAMPERES REVERSE CURRENT, DC NOMINAL |
| AFJQ |
STORAGE TEMP RANGE |
-65.0/+150.0 DEG CELSIUS |
| CZER |
MEMORY DEVICE TYPE |
PAL |
| CTFT |
CASE OUTLINE SOURCE AND DESIGNATOR |
C-2A MIL-M-38510 |
| CQZP |
INPUT CIRCUIT PATTERN |
16 INPUT |
| ADAU |
BODY HEIGHT |
0.060 INCHES MINIMUM AND 0.078 INCHES MAXIMUM |
| CQWX |
OUTPUT LOGIC FORM |
COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
| TEST |
TEST DATA DOCUMENT |
96906-MIL-STD-883 STANDARD |
| CQSJ |
INCLOSURE MATERIAL |
SILICON |
| CQSZ |
INCLOSURE CONFIGURATION |
LEADLESS FLAT PACK |
| CZEQ |
TIME RATING PER CHACTERISTIC |
20.00 NANOSECONDS NOMINAL ACCESS |
| CXCY |
PART NAME ASSIGNED BY CONTROLLING AGENCY |
MICROCIRCUITS, DIGITAL, CMOS PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON |
| TTQY |
TERMINAL TYPE AND QUANTITY |
20 LEADLESS |
| CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |
| CZEP |
CAPITANCE RATING PER CHARACTERISTIC |
7.00 INPUT PICOFARADS MAXIMUM AND 7.00 OUTPUT PICOFARADS MAXIMUM |