| CQSZ |
INCLOSURE CONFIGURATION |
DUAL-IN-LINE |
| CZER |
MEMORY DEVICE TYPE |
EPROM |
| CBBL |
FEATURES PROVIDED |
PROGRAMMED AND HERMETICALLY SEALED AND BURN IN AND ULTRAVIOLET ERASABLE |
| CSWJ |
WORD QUANTITY (NON-CORE) |
32768 |
| TTQY |
TERMINAL TYPE AND QUANTITY |
32 PIN |
| AFJQ |
STORAGE TEMP RANGE |
-65.0/+150.0 DEG CELSIUS |
| CTFT |
CASE OUTLINE SOURCE AND DESIGNATOR |
D-10 MIL-M-38510 |
| ADAU |
BODY HEIGHT |
4.40 MILLIMETERS MAXIMUM |
| ADAT |
BODY WIDTH |
12.70 MILLIMETERS MINIMUM AND 15.49 MILLIMETERS MAXIMUM |
| CQSJ |
INCLOSURE MATERIAL |
CERAMIC |
| AFGA |
OPERATING TEMP RANGE |
-40.0/+85.0 DEG CELSIUS |
| CQWX |
OUTPUT LOGIC FORM |
COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
| TEST |
TEST DATA DOCUMENT |
96906-MIL-STD-883 STANDARD |
| ADAQ |
BODY LENGTH |
37.85 MILLIMETERS MAXIMUM |
| CRHL |
BIT QUANTITY (NON-CORE) |
262144 |
| CZEN |
VOLTAGE RATING AND TYPE PER CHARACTERISTIC |
14.0 VOLTS NOMINAL TOTAL SUPPLY |
| CZEQ |
TIME RATING PER CHACTERISTIC |
70.00 NANOSECONDS MAXIMUM INPUT TO OUTPUT ACCESS |
| CTQX |
CURRENT RATING PER CHARACTERISTIC |
90.00 MILLIAMPERES AVERAGE FORWARD CURRENT AVERAGED OVER A FULL 60-HZ CYCLE PEAK |
| CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |