| CQSZ |
INCLOSURE CONFIGURATION |
DUAL-IN-LINE |
| AFGA |
OPERATING TEMP RANGE |
-55.0/+125.0 DEG CELSIUS |
| AEHX |
MAXIMUM POWER DISSIPATION RATING |
1960.0 MILLIWATTS |
| ZZZY |
REFERENCE NUMBER DIFFERENTIATING CHARACTERISTICS |
AREFERENCE NUMBER DIFFERENTIATING MATERIAL WILL BE IN ACCORDANCE WITH NAVAL INVENTORY CONTROL POINT ACTIVITY HX QUALITY CONTROL. MANUFACTURING AND TESTING SPECIFICATIONS AVAILABLE AT THE DLA ICP |
| TTQY |
TERMINAL TYPE AND QUANTITY |
20 PRINTED CIRCUIT |
| CZEN |
VOLTAGE RATING AND TYPE PER CHARACTERISTIC |
4.7 VOLTS MINIMUM INPUT AND 5.3 VOLTS MAXIMUM INPUT |
| FEAT |
SPECIAL FEATURES |
ITEM MUST COMPLY WITH REQUIREMENTS OF DEFENSE SUPPLY CENTER COLUMBUS PRODUCTION STANDARD NO. LO4971 |
| AFJQ |
STORAGE TEMP RANGE |
-65.0/+150.0 DEG CELSIUS |
| AGAV |
END ITEM IDENTIFICATION |
FILTERS E/I FSCM 04804; NUCLEAR POWER PLANTS |
| CXCY |
PART NAME ASSIGNED BY CONTROLLING AGENCY |
QUAD TTL/NMOS TO POSITIVE ECL TRANSLATOR MICROCIRCUIT |
| TEST |
TEST DATA DOCUMENT |
96906-MIL-STD-883 STANDARD |
| CRTL |
CRITICALITY CODE JUSTIFICATION |
FEAT |
| CQWX |
OUTPUT LOGIC FORM |
EMITTER-COUPLED LOGIC AND TRANSISTOR-TRANSISTOR LOGIC AND N-TYPE METAL OXIDE-SEMICONDUCTOR LOGIC |
| CSSL |
DESIGN FUNCTION AND QUANTITY |
4 TRANSLATOR, LOGIC |
| CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |