| CQSZ |
INCLOSURE CONFIGURATION |
DUAL-IN-LINE |
| AFGA |
OPERATING TEMP RANGE |
-55.0/+125.0 DEG CELSIUS |
| FEAT |
SPECIAL FEATURES |
ALTERED ITEM/HARDNESS CRITICAL ITEM/GENERIC P/N 22V10/CIRCUIT FUNCTION-22 INPUTS, 10 OUTPUTS, EECMOS, ARCHITECTURALLY GENERIC, PROGRAMMABLE AND-OR ARRAY |
| CZEN |
VOLTAGE RATING AND TYPE PER CHARACTERISTIC |
-0.5 VOLTS MINIMUM INPUT AND 7.0 VOLTS MAXIMUM INPUT |
| NHCF |
NUCLEAR HARDNESS CRITICAL FEATURE |
HARDENED |
| CZEQ |
TIME RATING PER CHACTERISTIC |
15.00 NANOSECONDS AF OUTPUT MEGAWATTS |
| SUPP |
SUPPLEMENTARY FEATURES |
PROGRAMMING DISK P/N 10154403-101/PROGRAMMING FILE NAME-54391101JED/CHECK SUM 4D1BHEX |
| TTQY |
TERMINAL TYPE AND QUANTITY |
24 PRINTED CIRCUIT |
| AFJQ |
STORAGE TEMP RANGE |
-65.0/+150.0 DEG CELSIUS |
| CBBL |
FEATURES PROVIDED |
ASYNCHRONOUS AND ELECTROSTATIC SENSITIVE AND MONOLITHIC AND PROGRAMMABLE |
| AGAV |
END ITEM IDENTIFICATION |
AIRCRAFT, B-2 BOMBER (ATB) |
| CXCY |
PART NAME ASSIGNED BY CONTROLLING AGENCY |
MICROCIRCUIT, PAL, QUAD 20 INPUT AND-OR INVERT |
| CQSJ |
INCLOSURE MATERIAL |
CERAMIC AND GLASS |
| CQWX |
OUTPUT LOGIC FORM |
COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
| TEST |
TEST DATA DOCUMENT |
96906-MIL-STD-883 STANDARD |
| AEHX |
MAXIMUM POWER DISSIPATION RATING |
1.5 WATTS |
| CSSL |
DESIGN FUNCTION AND QUANTITY |
1 ARRAY, LOGIC |
| CRTL |
CRITICALITY CODE JUSTIFICATION |
FEAT |
| CWSG |
TERMINAL SURFACE TREATMENT |
SOLDER |