6625-00-367-9323 ( 120 )
NSN Information
| NSN | FSC | NIIN | Item Name | INC |
|---|---|---|---|---|
| 6625-00-367-9323 | 6625 | 003679323 | TEST SET,SEMICONDUCTOR DEVICE | 2500 |
NSN Features
| MRC | Parameter | Characteristics |
|---|---|---|
| ANPZ | INCLOSURE FEATURE | SINGLE ITEM W/HOUSING |
| FCLS | FUNCTIONAL CLASSIFICATION | AA-9.3 |
| SUPP | SUPPLEMENTARY FEATURES | MANUFACTURERS NAME: TRANSISTOR TEST SET |
| AQXY | TEST TYPE FOR WHICH DESIGNED | MEASUREMENT OF TRANSISTORS |
Manufacturing Part Numbers (SKUs)
| Part SKU | Cage | Status | RNVC | RNCC | SADC | DAC | RNAAC |
|---|---|---|---|---|---|---|---|
| 120 | 51089 | F | 2 | 3 | 6 | SB |
Manufacturers
| Part SKU | Cage | Manufacturer | Type | Status |
|---|---|---|---|---|
| 120 | 51089 | FAIRCHILD SEMICONDUCTOR CORP | A | F |
FLIS Identification
| PMIC | ADPE Code | CRITL Code | DEMIL Code | DEMIL INTG | NIIN Asgt | ESD | HMIC | ENAC | Schedule-B | INC |
|---|---|---|---|---|---|---|---|---|---|---|
| A | 0 | X | Q | 6 | 02/27/1 | A | P | 9030908030 | 2500 |
FLIS Management
| MOE | REC Rep Code | Mgmt Ctl | USC | Phrase Code | Phrase Statement |
|---|---|---|---|---|---|
| DF | U | --YRH-X | L | F | WHEN EXHAUSTED USE 6625-01-058-9564 |
Demilitarization Codes & Management
| DML | PMI | HMIC | ADP | CC | ESDC |
|---|---|---|---|---|---|
| Q | A | P | 0 | X | A |
Miscellaneous Management
| MOE (S_A) | SOS | AAC | QUP | UI | SLC | CIIC | RC | MCC | SVC |
|---|---|---|---|---|---|---|---|---|---|
| DF | FLZ | V | 1 | EA | 0 | U | --YRH-X | L |
Management Control Army
| MATCAT 1 | MATCAT 2 | MATCAT 3 | MATCAT 4 5 | ARC |
|---|
Freight
| NMFC | NMFC SUB | UFC | HMC | LTL | LCL | WCC | TCC | SHC | ADC | ACC | ASH | NMF DESC |
|---|---|---|---|---|---|---|---|---|---|---|---|---|
| 061700 | X | 34580 | J | P | 72D | Z | Q | A | A | Q | ELEC APPLIANCES/INSTRUMENTS NOI |